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1

Inhibition of HIV-1 Integrase by Galloyl Glucoses from Terminalia chebula and Flavonol Glycoside Gallates from Euphorbia pekinensis

Ahn, Mi-Jeong, Kim, Chul Young, Lee, Ji Suk, Kim, Tae Gyun, Kim, Seung Hee, Lee, Chong-Kyo, Lee, Bo-Bin, Shin, Cha-Gyun, Huh, Hoon, Kim, Jinwoong

Journal:

Year:

2002

Language:

english

File:

PDF, 82 KB

english, 2002

2

Combining Linear-Scaling DFT with Subsystem DFT in Born-Oppenheimer and Ehrenfest Molecular Dynamics simulations: from Molecules to a Virus in Solution.

Andermatt, Samuel, Cha, Jinwoong, Schiffmann, Florian, VandeVondele, Joost

Journal:

Journal of Chemical Theory and Computation

Year:

2016

Language:

english

File:

PDF, 5.46 MB

english, 2016

3

Direct observation of impact propagation and absorption in dense colloidal monolayers

Buttinoni, Ivo, Cha, Jinwoong, Lin, Wei-Hsun, Job, Stéphane, Daraio, Chiara, Isa, Lucio

Journal:

Proceedings of the National Academy of Sciences

Year:

2017

Language:

english

File:

PDF, 2.33 MB

english, 2017

4

Inhibition of HIV-1 reverse transcriptase and HIV-1 integrase and antiviral activity of Korean seaweed extracts

Mi-Jeong Ahn, Kee-Dong Yoon, Chul Young Kim, So-Young Min, Yong-ung Kim, Hyun Jin Kim, Jeong Ha Kim, Cha-Gyun Shin, Chong-Kyo Lee, Tae Gyun Kim, Seung Hee Kim, Hoon Huh, Jinwoong Kim

Journal:

Journal of Applied Phycology

Year:

2002

Language:

english

File:

PDF, 72 KB

english, 2002

5

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Baltimore, Maryland, USA (Monday 23 April 2012)] Three-Dimensional Imaging, Visualization, and Display 2012 - Face and eye tracking for sub-hologram-based digital holographic display system

Lee, Heekyung, Javidi, Bahram, Son, Jung-Young, Park, Min-sik, Cha, Jihun, Martinez-Corral, Manuel, Osten, Wolfgang, Kim, Jinwoong, Okano, Fumio

Year:

2012

Language:

english

File:

PDF, 1004 KB

english, 2012

6

Crystalline Silver Nanoparticles by Using Polygala tenuifolia Root Extract as a Green Reducing Agent

Jun, Sang Hui, Cha, Song-Hyun, Kim, Jinwoong, Cho, Seonho, Park, Youmie

Journal:

Journal of Nanoscience and Nanotechnology

Year:

2015

Language:

english

File:

PDF, 562 KB

english, 2015

7

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Methodical approach to improve defect detection sensitivity on lithography process using DUV inspection system

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 265 KB

english, 2007

8

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Characterizing optical proximity effect difference among exposure tools

Hong, Jongkyun, Archie, Chas N., Lee, Jeonkyu, Kang, Eunsuk, Yang, Hyunjo, Yim, Donggyu, Kim, Jinwoong

Year:

2006

Language:

english

File:

PDF, 271 KB

english, 2006

9

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Inspection sensitivity improvement through optimization of lobe blocking on high-end memory devices

Lee, Changgoo, Archie, Chas N., Won, Sera, Seo, Daeyoung, Kim, Hyeonsoo, Kim, Jinwoong, Yeo, Jeong-Ho, Dolev, Ido, Kwak, Chan-Hee

Year:

2007

Language:

english

File:

PDF, 580 KB

english, 2007

10

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - Application of scatterometry to measure organic material profile

Koo, Sunyoung, Archie, Chas N., Ban, Keundo, Lim, Chang-moon, Bok, Cheolkyu, Moon, Seung-Chan, Kim, Jinwoong

Year:

2006

Language:

english

File:

PDF, 567 KB

english, 2006

11

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Metrology, Inspection, and Process Control for Microlithography XX - New OPC verification method using die-to-database inspection

Yang, Hyunjo, Archie, Chas N., Choi, Jaeseung, Cho, Byungug, Hong, Jongkyun, Song, Jookyoung, Yim, Donggyu, Kim, Jinwoong, Yamamoto, Masahiro

Year:

2006

Language:

english

File:

PDF, 1.83 MB

english, 2006

12

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Advanced process control with design-based metrology

Yang, Hyunjo, Archie, Chas N., Kim, Jungchan, Hong, Jongkyun, Yim, Donggyu, Kim, Jinwoong, Hasebe, Toshiaki, Yamamoto, Masahiro

Year:

2007

Language:

english

File:

PDF, 441 KB

english, 2007

13

Electrical tuning of elastic wave propagation in nanomechanical lattices at MHz frequencies

Cha, Jinwoong, Daraio, Chiara

Journal:

Nature Nanotechnology

Year:

2018

Language:

english

File:

PDF, 2.99 MB

english, 2018

14

Experimental realization of on-chip topological nanoelectromechanical metamaterials

Cha, Jinwoong, Kim, Kun Woo, Daraio, Chiara

Journal:

Year:

2018

Language:

english

File:

PDF, 8.81 MB

english, 2018